JPH0220679Y2 - - Google Patents

Info

Publication number
JPH0220679Y2
JPH0220679Y2 JP1980076084U JP7608480U JPH0220679Y2 JP H0220679 Y2 JPH0220679 Y2 JP H0220679Y2 JP 1980076084 U JP1980076084 U JP 1980076084U JP 7608480 U JP7608480 U JP 7608480U JP H0220679 Y2 JPH0220679 Y2 JP H0220679Y2
Authority
JP
Japan
Prior art keywords
rays
solar slit
sample
slit
solar
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1980076084U
Other languages
English (en)
Japanese (ja)
Other versions
JPS57651U (en]
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1980076084U priority Critical patent/JPH0220679Y2/ja
Publication of JPS57651U publication Critical patent/JPS57651U/ja
Application granted granted Critical
Publication of JPH0220679Y2 publication Critical patent/JPH0220679Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
JP1980076084U 1980-05-30 1980-05-30 Expired JPH0220679Y2 (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1980076084U JPH0220679Y2 (en]) 1980-05-30 1980-05-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1980076084U JPH0220679Y2 (en]) 1980-05-30 1980-05-30

Publications (2)

Publication Number Publication Date
JPS57651U JPS57651U (en]) 1982-01-05
JPH0220679Y2 true JPH0220679Y2 (en]) 1990-06-05

Family

ID=29438740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1980076084U Expired JPH0220679Y2 (en]) 1980-05-30 1980-05-30

Country Status (1)

Country Link
JP (1) JPH0220679Y2 (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0218566Y2 (en]) * 1985-05-02 1990-05-24

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS514712U (en]) * 1974-06-21 1976-01-14
JPS5111493A (en]) * 1974-07-19 1976-01-29 Hitachi Ltd
JPS5355094A (en) * 1976-10-28 1978-05-19 Jeol Ltd X-ray microanalyzer
JPS5811011Y2 (ja) * 1977-05-23 1983-03-01 日本電子株式会社 X線検出装置
JPS55113955U (en]) * 1979-02-02 1980-08-11

Also Published As

Publication number Publication date
JPS57651U (en]) 1982-01-05

Similar Documents

Publication Publication Date Title
JP2567736B2 (ja) イオン散乱分析装置
JPH0220679Y2 (en])
CN109923408A (zh) 离子分析装置
JP4606270B2 (ja) 試料イオンの飛行時間測定用装置,飛行時間型質量分析装置,飛行時間型質量分析方法
US2574632A (en) Radiation detection and measuring apparatus and method
JP3541573B2 (ja) レーザー脱離イオン化質量分析装置
JP6309381B2 (ja) 質量分析装置および質量分析方法
JPS5811011Y2 (ja) X線検出装置
JPH11354072A (ja) レーザイオン化中性粒子質量分析装置および分析方法
JPH0637564Y2 (ja) 中性粒子散乱分析装置
JPS59141045A (ja) X線分析装置
JPH0355239Y2 (en])
JPS599850B2 (ja) X センコウデンシブンセキホウホウ
SU141559A1 (ru) Способ изотопного и химического масс-спектрального анализа
JPS5820103B2 (ja) 質量分析装置
JPS61148758A (ja) 表面分析装置
JPH05251035A (ja) スパッタ中性粒子質量分析装置
JPH0341402Y2 (en])
JPH0197365A (ja) エネルギー分析器
JPH06103625B2 (ja) イオンマイクロアナライザ
JP2917475B2 (ja) X線分析装置
JP2705189B2 (ja) 粒子分析装置
JPH0115986B2 (en])
JPS5958345A (ja) 濃度測定装置
SU741066A1 (ru) Способ учета неселективных помех в атомно-абсорбционной спектрофотометрии